The facility specializes in the characterization of surfaces, films, magnetic & layered materials, and crystalline/polycrystalline materials.
Manhattan, NY (Morningside)
The facility includes a 200KV TEM, two SEMs and a suite of sample preparation instruments.
The facility houses a 300 kV cryo-EM, a 200kV Cs corrected S/TEM, a 120kV TEM, a dual beam SEM/FIB, and a super-resolution STED microscope.
Manhattan, NY (Harlem)
The facility offers surface analysis instrumentation including XPS, TOF-SIMS and AFM.